Registered Research Service Providers
ANSTO is a registered Research Service Provider (RSP), registration number 12657, under section 29A of the Industry Research and Development Act 1986.
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ANSTO is a registered Research Service Provider (RSP), registration number 12657, under section 29A of the Industry Research and Development Act 1986.
ANSTO has agreed to participate in an Australian trial of a review of research infrastructure access proposals in which applicants remain anonymous to aid the removal of structural barriers to the career progression of Women in STEM.
In 2023 ANSTO produced its 2nd Innovate Reconciliation Action Plan to guide reconciliation actions.
Inaugural speaker returns to deliver lecture on progress of the world largest engineering project to create fusion energy
ANSTO provides a range of capabilities using neutrons, X-rays and infrared radiation to study the solids, liquids and gases that might be found in materials in our solar system and beyond.
Project Bright, the construction of eight new beamlines at ANSTO’s Australian Synchrotron has reached a milestone by achieving ‘First Light’ for the new micro-computed tomography (MCT) beamline in late NovembeR.
ANSTO provides a range of capabilities using neutrons, X-rays and infrared radiation to study the solids, liquids and gases that might be found in materials in our solar system and beyond.
Insights into the behaviour of structural materials in a molten salt environment
Particle Induced X-ray Emission (PIXE) is a powerful and relatively simple analytical technique that can be used to identify and quantify trace elements typically ranging from aluminium to to uranium.
The X-ray Fluorescence Nanoprobe beamline undertakes high-resolution X-ray microspectroscopy, elemental mapping and coherent diffraction imaging – providing a unique facility capable of spectroscopic and full-field imaging. Elemental mapping and XANES studies will be possible at sub-100 nm resolution, with structural features able to be studied down to 15 nm using scanning X-ray diffraction microscopy.