Technical Information - XFM beamline
The beamline has two probes optimised for studies at length-scales spanning 2 orders of magnitude. A milliprobe has a resolution of around 100 µm and a Kirkpatrick-Baez (KB) mirror microprobe is optimised for applications requiring high flux at the micron length scale. These systems can be used to obtain maps of elemental distribution and for a range of spectroscopic applications such as determining oxidation state and speciation.
Beamline Properties | |
Source | In-Vacuum Undulator |
Monochromation | Si DCM, <1,1,1> OR <3,1,1> reflection |
Energy Range | 4.1 - 27 keV |
Energy Resolution | ΔE/E ~ 10-4 |
Typical probe performance (10 keV) | |||
Focusing method | milliprobe | microprobe | |
Resolution[µm] | 50 - 200 | 1 - 5 | |
Scan range [mm * mm] | 600 * 1200 | 140 * 100 | |
Flux @ coarsest resolution [ph/s] | 1012 | 4 . 1011 | |
Flux density [ph/s/µm2] | 106 | 1010 |
Detector characteristics | ||
Type | Vortex EM-90 | Maia Rev C or D |
Geometry | 90-degree | 180-degree |
Minimum Energy | 1.6 keV | 2.0 keV |
Solid Angle | 0.1 sr | 1.1 sr |
Peak count rate | 500 kHz | 1.4 MHz |
Energy Resolution [eV] | 120 | 275 |