Particle Induced X-ray Emission
Particle Induced X-ray Emission (PIXE) is a powerful and relatively simple analytical technique that can be used to identify and quantify trace elements typically ranging from aluminium to to uranium.
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Particle Induced X-ray Emission (PIXE) is a powerful and relatively simple analytical technique that can be used to identify and quantify trace elements typically ranging from aluminium to to uranium.
Planning is now underway for a second repatriation project which is scheduled to take place in 2022. Find out more information.
The nature of Metal-Oxide-Semiconductor Field Effect Transistors (MOSFETs) present a fascinating paradox in space exploration. Their strength in radiation detection becomes their weakness in space operations, exposing an Achilles' heel for NASA. Yet, these same devices monitor radiation doses received by humans on earth and in space.
Research demonstrates the existence of hexagonal planar geometry in a transition metal complex with great potential application across multiple disciplines.
3D models of multilayered structures on engineering scale from nanoscale damage profiles.
Highlights of the Energy Materials Project.
Publications and resources from the Powder Diffraction beamline.