In addition to sovereign radiation testing facilities, ANSTO offers capabilities that help users maximize test planning, execution, and results interpretation.
Integrated Circuit Decapsulation
Integrated circuits (IC) are commonly embedded in plastic packagingto protect the delicate chip die and bond wires, which hinders quality control procedures and radiation testing.
The Centre for Accelerator Science at ANSTO has developed facilities to decapsulate ICs using milling and heated acid jets, exposing the die while keeping it functional.
The etching process is tailored to each device's design, enabling radiation hardness testing essential for space applications. Full exposure of the die allows for imaging of specific regions and precise targeting to investigate their sensitivity. Additionally, direct exposure to radiation eliminates issues of energy and LET degradation caused by the packaging.
GEANT4 Simulation
A GEANT4 Monte Carlo model was developed for the evaluation of LET and dose rate profiles during irradiation of custom targets on microprobe beamlines. The propagation of ion beam is tracked, and each interaction of primary and secondary particles are modelled with nm spatial accuracy. Sample structure and material composition is reproduced to consider for any beam degradation, such as loss in energy, variation in LET and dose delivered to the sensitive areas.
The simulation capability not only provides precise information for results analysis, but also a powerful tool to custom-tune the beam characteristics to satisfy users requirement on a large variety of samples.
Expertise
The team of scientists at ANSTO boasts exceptional and diverse expertise, enabling researchers to conduct a wide variety of tests with precision and efficiency. Their comprehensive knowledge and advanced facilities have been instrumental in supporting numerous research projects, particularly in fields requiring sophisticated testing and analysis, such as radiation hardness testing and materials science.
