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PIXE Microbeam on Sirius

Particle Induced X-ray Emission

Particle Induced X-ray Emission (PIXE) is a powerful and relatively simple analytical technique that can be used to identify and quantify trace elements typically ranging from aluminium to to uranium.

ANSTO Staff member reviewing data on computer screen in Minerals pilot facility

Facilities

ANSTO has a full suite of mineralogical, chemical and hydrometallurgical facilities from laboratory through to pilot scale.

Hutch B

Publications

Publications and resources from the Powder Diffraction beamline.

Anna Sokolova
Instrument Scientist BILBY (SANS)/Small Angle Scattering Group Manager

Role at ANSTO

Yang Cao
Beamline Scientist - ADS

Role at ANSTO 

Pagination